In Yong Park
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Principal researcher
Also affiliated: Texas A&M University (2001)
Graduate Student Researcher
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Biography and Research Information
OverviewAI-generated summary
In Yong Park's research focuses on advanced metrology techniques, particularly those utilizing scanning electron microscopy (SEM). His work includes the development of a low-voltage SEM and a reflective electron energy loss spectroscopy (EELS) system tailored for semiconductor applications. Park also investigates the generation of coherent EUV pulses through high harmonic generation and studies surface plasmons. He contributes to standardization efforts as an expert for ISO/TC 202/ SC 4, which addresses scanning electron microscopy. Park has published three works with 118 citations and an h-index of 1.
Metrics
- h-index: 1
- Publications: 3
- Citations: 133
Selected Publications
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Finite-Temperature Renormalization of Standard Model Coupled with Gravity, and its Implications for Cosmology (2025)
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