Biography and Research Information
OverviewAI-generated summary
Bahktiyar Mohammed Nafis's research focuses on the reliability of electronic components, specifically investigating novel materials for capacitor applications. His work has involved the reliability evaluation of a metal oxide-aluminum glycerol film capacitor, utilizing nonlinear degradation modeling that accounts for dependency considerations. This research contributes to understanding material behavior under stress and developing more durable electronic devices.
Nafis has collaborated with Xiangbo Meng, Ekene Gabriel Okafor, and Andrew Leda, all from the University of Arkansas at Fayetteville, on shared publications. His recent activity indicates ongoing engagement in the field.
Metrics
- Publications: 1
Selected Publications
-
Reliability evaluation of a novel metal oxide-aluminum glycerol film capacitor using nonlinear degradation modeling with dependency considerations (2023)
Collaboration Network
Top Collaborators
Ekene Gabriel Okafor
University of Arkansas at Fayetteville
1 shared publication
In database
- Reliability evaluation of a novel metal oxide-aluminum glycerol film capacitor using nonlinear degradation modeling with dependency considerations
Xin Wang
University of Arkansas at Fayetteville (US)
1 shared publication
- Reliability evaluation of a novel metal oxide-aluminum glycerol film capacitor using nonlinear degradation modeling with dependency considerations
Andrew Leda
University of Arkansas at Fayetteville
1 shared publication
In database
- Reliability evaluation of a novel metal oxide-aluminum glycerol film capacitor using nonlinear degradation modeling with dependency considerations
David Huitink
University of Arkansas at Fayetteville
1 shared publication
In database
- Reliability evaluation of a novel metal oxide-aluminum glycerol film capacitor using nonlinear degradation modeling with dependency considerations
Xiangbo Meng
University of Arkansas at Fayetteville
1 shared publication
In database
- Reliability evaluation of a novel metal oxide-aluminum glycerol film capacitor using nonlinear degradation modeling with dependency considerations
Similar Researchers
Based on overlapping research topics
Joseph J DeMark
University of Arkansas at Fayetteville
Metal and Thin Film Mechanics
Semiconductor materials and devices
Advancements in Semiconductor Devices and Circuit Design
Kristofor R. Brye
University of Arkansas at Fayetteville
Metal and Thin Film Mechanics
Semiconductor materials and devices
Advancements in Semiconductor Devices and Circuit Design
Palaniappan Chinnakaruppan
University of Arkansas at Fayetteville
Metal and Thin Film Mechanics
Semiconductor materials and devices
Advancements in Semiconductor Devices and Circuit Design
Alicia Medina Garcia
University of Arkansas at Fayetteville
Metal and Thin Film Mechanics
Semiconductor materials and devices
Advancements in Semiconductor Devices and Circuit Design
Ty McNutt
University of Arkansas at Fayetteville
Metal and Thin Film Mechanics
Semiconductor materials and devices
Advancements in Semiconductor Devices and Circuit Design
Aida Sheibani
University of Arkansas at Fayetteville
Metal and Thin Film Mechanics
Semiconductor materials and devices
Advancements in Semiconductor Devices and Circuit Design