Ashby Philip John
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Researcher
Graduate Student Researcher
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Biography and Research Information
OverviewAI-generated summary
Ashby Philip John's research focuses on the characterization and functionalization of two-dimensional materials, particularly graphene and hexagonal boron nitride heterostructures. His work involves utilizing Atomic Force Microscopy to measure surface roughness and investigating the modification of graphene field-effect transistors for sensor applications.
He is actively involved in a significant federal grant, serving as Co-Principal Investigator on the "Mid-Scale RI-1 (M1:IP): Implementation of a National Silicon Carbide Research Fabrication Facility" project, which received $17,874,768 in funding from the National Science Foundation. This project aims to establish a national facility for silicon carbide research and fabrication.
John collaborates with researchers at the University of Arkansas at Fayetteville, including Evans Addo-Mensah, Fernando Maia de Oliveira, Hugh Churchill, and Uchechukwu C. Wejinya, with whom he has co-authored multiple publications. He also leads a research group.
Metrics
- h-index: 1
- Publications: 3
- Citations: 1
Selected Publications
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Functionalizing Graphene Field-Effect Transistors for Sensor Applications (2025)
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Surface Roughness Measurement of Functionalized CVD Graphene and Hexagonal Boron Nitride Heterostructures Using Atomic Force Microscopy (2024)
Federal Grants 1 $17,874,768 total
Mid-Scale RI-1 (M1:IP): Implementation of a National Silicon Carbide Research Fabrication Facility
Collaboration Network
Top Collaborators
- Surface Roughness Measurement of Functionalized CVD Graphene and Hexagonal Boron Nitride Heterostructures Using Atomic Force Microscopy
- Functionalizing Graphene Field-Effect Transistors for Sensor Applications
- Surface Roughness Measurement of Functionalized CVD Graphene and Hexagonal Boron Nitride Heterostructures Using Atomic Force Microscopy
- Functionalizing Graphene Field-Effect Transistors for Sensor Applications
- Surface Roughness Measurement of Functionalized CVD Graphene and Hexagonal Boron Nitride Heterostructures Using Atomic Force Microscopy
- Surface Roughness Measurement of Functionalized CVD Graphene and Hexagonal Boron Nitride Heterostructures Using Atomic Force Microscopy
- Surface Roughness Measurement of Functionalized CVD Graphene and Hexagonal Boron Nitride Heterostructures Using Atomic Force Microscopy
- Functionalizing Graphene Field-Effect Transistors for Sensor Applications
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