Fernando Maia de Oliveira Data-verified

Affiliation confirmed via AI analysis of OpenAlex, ORCID, and web sources.

Professor Adjunto

Last publication 2026 Last refreshed 2026-05-16

faculty

10 h-index 60 pubs 389 cited

Biography and Research Information

OverviewAI-generated summary

Fernando Maia de Oliveira's research centers on semiconductor materials and devices, with a focus on group IV and III-V semiconductor heterostructures. He investigates the growth mechanisms, material quality, and physical properties of materials such as Germanium-Tin (GeSn) and Gallium Nitride (GaN) alloys. His work explores the role of dislocations and strain relief in the diffusion and electrical properties of these materials, particularly in the context of advanced electronic and optoelectronic applications. Oliveira's recent publications include studies on the thermal stability of GaN-based magnetic field sensors and the sensitivity of novel quantum well Hall sensors. He also examines the growth of direct bandgap GeSn on GaAs substrates and the formation mechanisms of Ge stripes banded by GeSn Nanowires, including their electrical switching properties. Oliveira collaborates extensively with colleagues at the University of Arkansas at Fayetteville, including Yuriy I. Mazur and Hryhorii Stanchu, with whom he has co-authored numerous publications. His scholarship metrics include an h-index of 10, with 59 total publications and 382 total citations.

Metrics

  • h-index: 10
  • Publications: 60
  • Citations: 389

Selected Publications

  • Epitaxial Growth and Structural Evolution of Lattice-Matched SiGeSn/Ge Heterostructures with Si Composition up to 42% (2026)
  • Impedance spectroscopy and AC conductivity mechanism in GeSn thin films (2026)
  • Dual-channel 2DEG micro-Hall effect sensor for extreme environments (2026)
  • Plasma-Enhanced Graphene Coatings on Ti-6Al-4V: Insights from Non-Destructive Characterization (2026)
  • Durable Low-Friction Graphite Coatings Enabled by a Polydopamine Adhesive Underlayer (2025)
  • X-ray diffraction study of Ge islands on Si(001) grown by aspect ratio trapping (2025)
  • Tip-induced nanoscale engineering of surface potential and conductivity in GeSn alloys (2025)
  • Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn (2025)
    3 citations DOI OpenAlex
  • MBE growth and characterization of strained GeSn/Ge multiple quantum well structures (2025)
    4 citations DOI OpenAlex
  • Temperature dependent optical properties of ultrathin InAs quantum well (2024)
  • Surface Roughness Measurement of Functionalized CVD Graphene and Hexagonal Boron Nitride Heterostructures Using Atomic Force Microscopy (2024)
    1 citation DOI OpenAlex
  • High-Quality Single-Step Growth of GaAs on C-Plane Sapphire by Molecular Beam (2024)
    1 citation DOI OpenAlex
  • Effect of temperature on the stability and performance of III-nitride HEMT magnetic field sensors (2024)
    1 citation DOI OpenAlex
  • Development of aspect ratio trapping growth of GeSn on Si for midwave infrared applications (2024)
    3 citations DOI OpenAlex
  • Improved Quality of InN Thin Films Using a Thin InGaN Compressive Strain Gradient Layer (2024)

View all publications on OpenAlex →

Collaboration Network

101 Collaborators 23 Institutions 8 Countries

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