Alexis Krone Data-verified
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Biography and Research Information
OverviewAI-generated summary
Alexis Krone's research focuses on the design, optimization, and characterization of gallium nitride (GaN)-based power modules and sensors. Her work has investigated multichip GaN power modules, including gate driver integration and double-sided cooling designs, with publications detailing 650V/60A modules. Krone has also studied the thermal stability and high-temperature degradation modes of GaN-based Hall-effect sensors, examining their performance in demanding environments. Her research collaborations include work with David Huitink, Satish Shetty, Md Maksudul Hossain, and Oluwatobi Olorunsola at the University of Arkansas at Fayetteville. Krone's scholarship metrics include an h-index of 5, with 8 total publications and 68 total citations.
Metrics
- h-index: 5
- Publications: 8
- Citations: 68
Selected Publications
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Thermal stability study of gallium nitride based magnetic field sensor (2023)
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Design and Optimization of Gate Driver Integrated Multichip 3-D GaN Power Module (2022)
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High Temperature Degradation Modes Observed in Gallium Nitride-Based Hall-Effect Sensors (2022)
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Thermal and Electrical Co-Optimization of a Multi-Chip Double-Sided Cooled GaN Module (2021)
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A 650V/60A Gate Driver Integrated Wire-bondless Multichip GaN Module (2021)
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Design and Optimization of 650V/60A Double-Sided Cooled Multichip GaN Module (2021)
Collaboration Network
Top Collaborators
- Design and Optimization of Gate Driver Integrated Multichip 3-D GaN Power Module
- A 650V/60A Gate Driver Integrated Wire-bondless Multichip GaN Module
- Design and Optimization of 650V/60A Double-Sided Cooled Multichip GaN Module
- Thermal stability study of gallium nitride based magnetic field sensor
- High Temperature Degradation Modes Observed in Gallium Nitride-Based Hall-Effect Sensors
Showing 5 of 7 shared publications
- Design and Optimization of Gate Driver Integrated Multichip 3-D GaN Power Module
- A 650V/60A Gate Driver Integrated Wire-bondless Multichip GaN Module
- Design and Optimization of 650V/60A Double-Sided Cooled Multichip GaN Module
- Thermal stability study of gallium nitride based magnetic field sensor
- Thermal and Electrical Co-Optimization of a Multi-Chip Double-Sided Cooled GaN Module
- Design and Optimization of Gate Driver Integrated Multichip 3-D GaN Power Module
- A 650V/60A Gate Driver Integrated Wire-bondless Multichip GaN Module
- Design and Optimization of 650V/60A Double-Sided Cooled Multichip GaN Module
- Thermal and Electrical Co-Optimization of a Multi-Chip Double-Sided Cooled GaN Module
- Design and Optimization of Gate Driver Integrated Multichip 3-D GaN Power Module
- A 650V/60A Gate Driver Integrated Wire-bondless Multichip GaN Module
- Design and Optimization of 650V/60A Double-Sided Cooled Multichip GaN Module
- Thermal and Electrical Co-Optimization of a Multi-Chip Double-Sided Cooled GaN Module
- Design and Optimization of Gate Driver Integrated Multichip 3-D GaN Power Module
- A 650V/60A Gate Driver Integrated Wire-bondless Multichip GaN Module
- Design and Optimization of 650V/60A Double-Sided Cooled Multichip GaN Module
- Design and Optimization of Gate Driver Integrated Multichip 3-D GaN Power Module
- A 650V/60A Gate Driver Integrated Wire-bondless Multichip GaN Module
- Design and Optimization of 650V/60A Double-Sided Cooled Multichip GaN Module
- Design and Optimization of Gate Driver Integrated Multichip 3-D GaN Power Module
- A 650V/60A Gate Driver Integrated Wire-bondless Multichip GaN Module
- Design and Optimization of 650V/60A Double-Sided Cooled Multichip GaN Module
- Thermal stability study of gallium nitride based magnetic field sensor
- High Temperature Degradation Modes Observed in Gallium Nitride-Based Hall-Effect Sensors
- Degradation of Gallium Nitride-Based Hall Effect Sensors in High Temperature Environments
- Thermal stability study of gallium nitride based magnetic field sensor
- High Temperature Degradation Modes Observed in Gallium Nitride-Based Hall-Effect Sensors
- Degradation of Gallium Nitride-Based Hall Effect Sensors in High Temperature Environments
- Thermal stability study of gallium nitride based magnetic field sensor
- High Temperature Degradation Modes Observed in Gallium Nitride-Based Hall-Effect Sensors
- Degradation of Gallium Nitride-Based Hall Effect Sensors in High Temperature Environments
- A 650V/60A Gate Driver Integrated Wire-bondless Multichip GaN Module
- Design and Optimization of 650V/60A Double-Sided Cooled Multichip GaN Module
- Design and Optimization of Gate Driver Integrated Multichip 3-D GaN Power Module
- Thermal and Electrical Co-Optimization of a Multi-Chip Double-Sided Cooled GaN Module
- Design and Optimization of Gate Driver Integrated Multichip 3-D GaN Power Module
- Thermal and Electrical Co-Optimization of a Multi-Chip Double-Sided Cooled GaN Module
- Design and Optimization of Gate Driver Integrated Multichip 3-D GaN Power Module
- Thermal and Electrical Co-Optimization of a Multi-Chip Double-Sided Cooled GaN Module
- Design and Optimization of Gate Driver Integrated Multichip 3-D GaN Power Module
- Thermal and Electrical Co-Optimization of a Multi-Chip Double-Sided Cooled GaN Module
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