Match tier Likely match
Presence Current · Arkansas
Last published 2026
Sources OpenAlex · ORCID
Refreshed 2026-08-15

Pengyu Lai

This is a likely match — the affiliation was inferred from OpenAlex, ORCID, and web sources but has not been fully confirmed. Treat with appropriate caution.

Researcher

Also affiliated: National Sun Yat-sen University (2008); Xidian University (2019); University of Electronic Science and Technology of China (2025); University of Arkansas System (2025); University of Hong Kong (1999–2002); National Cheng Kung University (2020)

Faculty Researcher

9 h-index 38 pubs 264 cited

  • Ceramics
  • Cold Temperature
  • Equipment Design
  • Hot Temperature
  • Temperature

Biography and Research Information

OverviewAI-generated summary

Pengyu Lai's research focuses on the development and characterization of semiconductor devices and materials for high-temperature and harsh environments. His work includes the design of components such as optocouplers and current sensors integrated with silicon carbide (SiC) MOSFETs and power modules. Lai has investigated methods for monitoring junction temperature in SiC MOSFETs and explored the use of Low-Temperature Cofired Ceramic (LTCC) packaging for these high-temperature applications. His publications also address the integration of gate drivers within high-density power modules and the development of SiC SCR devices for on-chip electrostatic discharge (ESD) protection. Lai collaborates with researchers at the University of Arkansas at Fayetteville, including Zhong Chen, Hui Wang, H. Alan Mantooth, and Salahaldein Ahmed, with whom he has co-authored multiple publications.

Metrics

  • h-index: 9
  • Publications: 38
  • Citations: 264

Selected Publications

  • Temperature-Dependent ESD Robustness in Micrometer 4H-SiC CMOS Technology (2026)
  • An Embedded High-Temperature LTCC Rogowski-Coil Current Sensor for SiC Intelligent Power Modules (2026)
    IEEE Transactions on Power Electronics DOI OpenAlex
  • Threshold Voltage Hysteresis and Bias Temperature Instabilities in SiC Low-Voltage CMOS Transistors (2026)
    Underline Science Inc. DOI OpenAlex
  • A New Simulation Method to Assess Temperature and Radiation Effects on SiC Resonant-Converter Reliability (2026)
    Materials DOI OpenAlex
  • A Simplified Gate Driver Architecture for Achieving Fast Switching in Medium-Voltage SiC Power Modules (2025)
  • TCAD-Aided Investigation of Temperature-Dependent Behavior in 4H-SiC P-Channel MOSFETs Up to 500°C (2025)
  • <i>(Invited)</i> High-Temperature Reliability of Ti-Based Ohmic Contacts to SiC (2025)
    ECS Meeting Abstracts DOI OpenAlex
  • Design Optimizations of Micrometer SiC CMOS Devices for High-Temperature IC Applications (2025)
    IEEE Transactions on Electron Devices 3 citations DOI OpenAlex
  • Design and Validation of a 100 kHz Inner-Paralleled Si+SiC Hybrid Multilevel Converter for Medium-Voltage Electric Traction Drives (2025)
    IEEE Transactions on Industry Applications 1 citation DOI OpenAlex
  • A 200 <sup>∘</sup>C SiC Phase-Leg Power Module With Integrated Gate Drivers: Development, Performance Assessment, and Path Forward (2025)
    IEEE Journal of Emerging and Selected Topics in Power Electronics 1 citation DOI OpenAlex
  • Design and Characterization of 1.2 kV Optically Isolated Half-Bridge Modules for High Temperature Operation (2024)
    1 citation DOI OpenAlex
  • Characterization of Silicon Carbide Low-Voltage n/p-Channel MOSFETs at High Temperatures (2024)
    IEEE Journal of the Electron Devices Society 5 citations DOI OpenAlex
  • Electrical Safe Operating Area and Latent Damage of SiC Low-Voltage nMOS Under TLP and VF-TLP Stresses (2024)
    IEEE Transactions on Electron Devices 3 citations DOI OpenAlex
  • A review of silicon carbide CMOS technology for harsh environments (2024)
    Materials Science in Semiconductor Processing 42 citations DOI OpenAlex
  • Electrical and thermal characterization of (250 °C) SiC power module integrated with LTCC-based isolated gate driver (2024)
    e-Prime - Advances in Electrical Engineering Electronics and Energy 2 citations DOI OpenAlex

View all publications on OpenAlex →

Collaboration Network

67 Collaborators 11 Institutions 2 Countries

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