Bakhtiyar Mohammad Nafis Source Confirmed
Affiliation confirmed via AI analysis of OpenAlex, ORCID, and web sources.
Researcher
University of Arkansas at Fayetteville
faculty
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Biography and Research Information
OverviewAI-generated summary
Bakhtiyar Mohammad Nafis's research focuses on assessing the reliability and safety of power electronic systems, particularly those utilizing Silicon Carbide (SiC) Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) for traction applications. His work includes system and component-level risk assessments, considering factors such as high coolant temperatures and demanding off-road mission profiles. Nafis also investigates advanced cooling techniques for high-voltage power electronics, such as dielectric fluid microchannel embedded source bussing terminals. Additionally, his research explores the reliability of materials used in power electronics, including sintered silver for die attachment, employing methods like cyclic isothermal bending tests under high temperature and strain rates. Nafis has a publication record of 15 papers, with 194 citations, and an h-index of 5. He has collaborated with David Huitink, Mohammad Hazzaz Mahmud, and Ange-Christian Iradukunda, all from the University of Arkansas at Fayetteville.
Metrics
- h-index: 5
- Publications: 15
- Citations: 194
Selected Publications
- Reliability Analysis of Sintered Silver (S-Ag) for Die Attachment Using a Four-Point Cyclic Isothermal Bend Test Approach at High Temperature and Strain Rates (2024) DOI
- Toward Direct Cooling in High Voltage Power Electronics: Dielectric Fluid Microchannel Embedded Source Bussing Terminal (2024) DOI
- System and Component Level Risk Assessment for SiC MOSFET Based Inverter for Traction Application at High Coolant Temperatures and Off-Road Mission Profile (2021) DOI
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