Justin Rudie Data-verified
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Biography and Research Information
OverviewAI-generated summary
Justin Rudie's research focuses on the development and characterization of semiconductor materials and devices, particularly for infrared detection applications. His work involves the creation of monolithic germanium-tin (GeSn) on silicon avalanche photodiodes, which are essential for sensing light in the short-wave infrared (SWIR) and extended SWIR spectrum. Rudie investigates the electronic properties and band alignment of various heterojunctions, including those involving β-(Al$_{0.21}$Ga$_{0.79}$)$_2$O$_3$/β-Ga$_2$O$_3$, AlGaAs/GeSn, and SiGeSn/GeSn quantum wells. His publications detail systematic studies on high-performance GeSn photodiodes with thick absorbers, aiming to achieve specific spectral response cutoffs, such as 2.14 micrometers. Rudie collaborates with researchers at the University of Arkansas at Fayetteville, including Sylvester Amoah, Sudip Acharya, Wei Du, and Perry C. Grant, contributing to a body of work in advanced semiconductor device physics.
Metrics
- h-index: 3
- Publications: 10
- Citations: 21
Selected Publications
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Study of electronic band alignment in SiGeSn/GeSn quantum well via internal photoemission effect (2025)
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Monolithically grown germanium-tin (GeSn) infrared avalanche photodiodes on silicon (Conference Presentation) (2025)
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Characterization of AlGaAs/GeSn heterojunction band alignment via X-ray photoelectron spectroscopy (2024)
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Development of Monolithic Germanium–Tin on Si Avalanche Photodiodes for Infrared Detection (2024)
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Band Offsets of the MOCVD-Grown β-(Al<sub>0.21</sub>Ga<sub>0.79</sub>)<sub>2</sub>O<sub>3</sub>/β-Ga<sub>2</sub>O<sub>3</sub> (010) Heterojunction (2022)
Collaboration Network
Top Collaborators
- Development of Monolithic Germanium–Tin on Si Avalanche Photodiodes for Infrared Detection
- Characterization of AlGaAs/GeSn heterojunction band alignment via X-ray photoelectron spectroscopy
- Monolithic Germanium Tin on Si Avalanche Photodiodes
- Characterization of AlGaAs/GeSn heterojunction band alignment via X-ray photoelectron spectroscopy
- Monolithically grown germanium-tin (GeSn) infrared avalanche photodiodes on silicon (Conference Presentation)
Showing 5 of 8 shared publications
- Characterization of AlGaAs/GeSn heterojunction band alignment via X-ray photoelectron spectroscopy
- Characterization of Algaas/Gesn Heterojunction Band Alignment Via X-Ray Photoelectron Spectroscopy
- Characterization of AlGaAs/GeSn heterojunction band alignment via X-ray photoelectron spectroscopy
- Study of electronic band alignment in SiGeSn/GeSn quantum well via internal photoemission effect
- Study of electronic band alignment in SiGeSn/GeSn quantum well via internal photoemission effect
Showing 5 of 7 shared publications
- Development of Monolithic Germanium–Tin on Si Avalanche Photodiodes for Infrared Detection
- Monolithic Germanium Tin on Si Avalanche Photodiodes
- Monolithically grown germanium-tin (GeSn) infrared avalanche photodiodes on silicon (Conference Presentation)
- Study of electronic band alignment in SiGeSn/GeSn quantum well via internal photoemission effect
- Ge0.95Sn0.05 on Si avalanche photodiode with Spectral Response Cutoff at 2.14 micrometer
Showing 5 of 6 shared publications
- Development of Monolithic Germanium–Tin on Si Avalanche Photodiodes for Infrared Detection
- Monolithic Germanium Tin on Si Avalanche Photodiodes
- Monolithically grown germanium-tin (GeSn) infrared avalanche photodiodes on silicon (Conference Presentation)
- Ge0.95Sn0.05 on Si avalanche photodiode with Spectral Response Cutoff at 2.14 micrometer
- Systematic study of high performance GeSn photodiodes with thick absorber for SWIR and extended SWIR detection
Showing 5 of 6 shared publications
- Development of Monolithic Germanium–Tin on Si Avalanche Photodiodes for Infrared Detection
- Monolithic Germanium Tin on Si Avalanche Photodiodes
- Monolithically grown germanium-tin (GeSn) infrared avalanche photodiodes on silicon (Conference Presentation)
- Study of electronic band alignment in SiGeSn/GeSn quantum well via internal photoemission effect
- Ge0.95Sn0.05 on Si avalanche photodiode with Spectral Response Cutoff at 2.14 micrometer
Showing 5 of 6 shared publications
- Study of electronic band alignment in SiGeSn/GeSn quantum well via internal photoemission effect
- Ge0.95Sn0.05 on Si avalanche photodiode with Spectral Response Cutoff at 2.14 micrometer
- Study of electronic band alignment in SiGeSn/GeSn quantum well via internal photoemission effect
- Systematic study of high performance GeSn photodiodes with thick absorber for SWIR and extended SWIR detection
- Systematic study of high performance GeSn photodiodes with thick absorber for SWIR and extended SWIR detection
- Development of Monolithic Germanium–Tin on Si Avalanche Photodiodes for Infrared Detection
- Monolithic Germanium Tin on Si Avalanche Photodiodes
- Monolithically grown germanium-tin (GeSn) infrared avalanche photodiodes on silicon (Conference Presentation)
- Ge0.95Sn0.05 on Si avalanche photodiode with Spectral Response Cutoff at 2.14 micrometer
- Development of Monolithic Germanium–Tin on Si Avalanche Photodiodes for Infrared Detection
- Monolithic Germanium Tin on Si Avalanche Photodiodes
- Monolithically grown germanium-tin (GeSn) infrared avalanche photodiodes on silicon (Conference Presentation)
- Ge0.95Sn0.05 on Si avalanche photodiode with Spectral Response Cutoff at 2.14 micrometer
- Development of Monolithic Germanium–Tin on Si Avalanche Photodiodes for Infrared Detection
- Monolithic Germanium Tin on Si Avalanche Photodiodes
- Monolithically grown germanium-tin (GeSn) infrared avalanche photodiodes on silicon (Conference Presentation)
- Ge0.95Sn0.05 on Si avalanche photodiode with Spectral Response Cutoff at 2.14 micrometer
- Development of Monolithic Germanium–Tin on Si Avalanche Photodiodes for Infrared Detection
- Monolithic Germanium Tin on Si Avalanche Photodiodes
- Monolithically grown germanium-tin (GeSn) infrared avalanche photodiodes on silicon (Conference Presentation)
- Ge0.95Sn0.05 on Si avalanche photodiode with Spectral Response Cutoff at 2.14 micrometer
- Development of Monolithic Germanium–Tin on Si Avalanche Photodiodes for Infrared Detection
- Monolithic Germanium Tin on Si Avalanche Photodiodes
- Monolithically grown germanium-tin (GeSn) infrared avalanche photodiodes on silicon (Conference Presentation)
- Ge0.95Sn0.05 on Si avalanche photodiode with Spectral Response Cutoff at 2.14 micrometer
- Study of electronic band alignment in SiGeSn/GeSn quantum well via internal photoemission effect
- Study of electronic band alignment in SiGeSn/GeSn quantum well via internal photoemission effect
- Systematic study of high performance GeSn photodiodes with thick absorber for SWIR and extended SWIR detection
- Systematic study of high performance GeSn photodiodes with thick absorber for SWIR and extended SWIR detection
- Band Offsets of the MOCVD-Grown β-(Al<sub>0.21</sub>Ga<sub>0.79</sub>)<sub>2</sub>O<sub>3</sub>/β-Ga<sub>2</sub>O<sub>3</sub> (010) Heterojunction
- Study of electronic band alignment in SiGeSn/GeSn quantum well via internal photoemission effect
- Study of electronic band alignment in SiGeSn/GeSn quantum well via internal photoemission effect
- Development of Monolithic Germanium–Tin on Si Avalanche Photodiodes for Infrared Detection
- Monolithic Germanium Tin on Si Avalanche Photodiodes
- Monolithically grown germanium-tin (GeSn) infrared avalanche photodiodes on silicon (Conference Presentation)
- Characterization of AlGaAs/GeSn heterojunction band alignment via X-ray photoelectron spectroscopy
- Characterization of Algaas/Gesn Heterojunction Band Alignment Via X-Ray Photoelectron Spectroscopy
- Characterization of AlGaAs/GeSn heterojunction band alignment via X-ray photoelectron spectroscopy
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