Match tier Confirmed
Presence Current · Arkansas
Last published 2024
Sources OpenAlex · ORCID
Refreshed 2026-08-08

Pijush K. Ghosh

Affiliation confirmed via AI analysis of OpenAlex, ORCID, and web sources.

PhD Student

Also affiliated: Indian Institute of Technology Madras (2018); University of Hyderabad (1997–1998)

Graduate Student Researcher

5 h-index 20 pubs 93 cited

  • Infrared Rays
  • Gold
  • Surface Plasmon Resonance
  • Nanostructures

Biography and Research Information

OverviewAI-generated summary

Pijush K. Ghosh is a PhD student at the University of Arkansas at Fayetteville whose research focuses on semiconductor materials and device engineering. His work involves investigating the properties of materials such as gallium nitride (GaN) and indium gallium nitride (InGaN) for applications in electronics, particularly in environments exposed to ionizing radiation. Ghosh has published research on topics including strain engineering in mismatched materials, the development of low-resistance Ohmic contacts, and the correlation between electrical and optical measurements in degenerate indium nitride (InN) thin films. His publications also explore energy band engineering to enhance the resilience of electronics against radiation damage, utilizing quantum gettering techniques. Ghosh collaborates with several researchers at the University of Arkansas, including Morgan E. Ware and Yuriy I. Mazur, with whom he has co-authored multiple publications.

Metrics

  • h-index: 5
  • Publications: 20
  • Citations: 93

Selected Publications

  • Spatially correlated stress-photoluminescence evolution in GaN/AlN multi-quantum wells (2024)
    Surfaces and Interfaces 2 citations DOI OpenAlex
  • Temperature dependent correlation of Hall effect and optical measurements of electron concentration in degenerate InN thin film (2023)
    Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena 1 citation DOI OpenAlex
  • Low resistance Ohmic contacts to graded InGaN (2022)
    Materials Science in Semiconductor Processing 4 citations DOI OpenAlex
  • Coherent-interface-induced strain in large lattice-mismatched materials: A new approach for modeling Raman shift (2021)
    Nano Research 17 citations DOI OpenAlex
  • Experiment-simulation comparison of luminescence properties of GaN/InGaN/GaN double graded structures (2021)
    Journal of Luminescence 2 citations DOI OpenAlex
  • Energy band engineering toward hardened electronics in ionizing radiation environments via quantum gettering (2021)
    Journal of Applied Physics 1 citation DOI OpenAlex
  • Luminescence Properties of GaN/InxGa1−xN/InyGa1−yN Double Graded Structures (Zigzag Quantum Wells) (2020)
    Journal of Electronic Materials 4 citations DOI OpenAlex
  • Investigation of the Structural and Optical Properties of Compositionally V‐Graded Strained In<sub><i>x</i></sub>Ga<sub>1–<i>x</i></sub>N Layers (2020)
    physica status solidi (b) 2 citations DOI OpenAlex
  • Plasmonic emission of hybrid Au/Ag bullseye nanostructures (2019)
    Materials Letters 5 citations DOI OpenAlex
  • Excitation intensity and thickness dependent emission mechanism from an ultrathin InAs layer in GaAs matrix (2018)
    Journal of Applied Physics 16 citations DOI OpenAlex
  • High temperature capacitors using AlN grown by MBE as the dielectric (2018)
    Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena 6 citations DOI OpenAlex
  • Kinetically controlled indium surface coverage effects on PAMBE-growth of InN/GaN(0001) quantum well structures (2018)
    Journal of Applied Physics 4 citations DOI OpenAlex
  • Calculated thickness dependent plasmonic properties of gold nanobars in the visible to near-infrared light regime (2017)
    PLoS ONE 23 citations DOI OpenAlex
  • Plasmonic resonance shift for various nanodevice geometries (2016)
    Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE DOI OpenAlex

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Collaboration Network

20 Collaborators 6 Institutions 3 Countries

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