Abu Shahir Md Khalid Hasan
Affiliation confirmed via AI analysis of OpenAlex, ORCID, and web sources.
Graduate Research Assistant
Also affiliated: Louisiana State University (2021)
Research Areas
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Biography and Research Information
OverviewAI-generated summary
Abu Shahir Md Khalid Hasan's research focuses on semiconductor materials and devices, with a particular emphasis on silicon carbide (SiC) and gallium nitride (GaN) technologies for power electronics applications. His work includes developing physics-based compact models for SiC power MOSFETs, incorporating temperature-scaling effects relevant for integrated circuit design. Hasan has investigated low-inductance power modules utilizing SiC and GaN high-electron-mobility transistors (HEMTs), contributing to advancements in power module design and performance.
His publications also explore the characteristics of emerging semiconductor materials like gallium oxide (Ga2O3), including single event upset phenomena and breakdown characteristics of Ga2O3 MOSFETs. Additionally, his research extends to voltage reference circuits for low-dropout voltage regulators. Hasan collaborates with several researchers at the University of Arkansas at Fayetteville, including Md Maksudul Hossain and Mohammad Dehan Rahman, with whom he shares multiple publications.
Metrics
- h-index: 6
- Publications: 25
- Citations: 118
Positions
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Graduate Research Assistant 2021–presentUniversity of Arkansas at Fayetteville EECS ORCID
Selected Publications
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Development of Low Inductance Direct Bonded Flipchip Gallium Nitride Module (2026)
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DC Modeling of 8 kV Depletion Mode Gallium Oxide MOSFET (2026)
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A New Simulation Method to Assess Temperature and Radiation Effects on SiC Resonant-Converter Reliability (2026)
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SEU Effect in E-Mode β-Ga 2 О 3 MOSFET with Epitaxial Drift Layer at the Breakdown Region (2025)
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Design and Evaluation of a 650 V, 300 A GaN-Based Power Module with Integrated Drivers and Ultra-Low Inductance Layout (2025)
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Thermal Analysis and Modeling of Gallium Oxide Diode-based Half Bridge Power Module (2025)
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Compact Modeling of β -Ga 2 O 3 Lateral Depletion Mode MOSFET (2025)
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Compact Model for a Ferroelectric Capacitor Compatible with Integrated Circuit Design in Harsh Environment (2025)
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Breakdown and C-V Characteristics Analysis of Depletion Mode Lateral β-Ga2O3 MOSFET (2025)
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Compact Model of β-Ga2O3 Schottky Barrier Diode (2025)
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Design of Low Parasitic Inductance GaN HEMT Flip-Chip Power Module (2025)
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A 0.8 V Bandgap Voltage Reference with High PSRR for Low-Dropout Voltage Regulator in 22nm FD-SOI (2024)
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High Temperature Characterization and Degradation Test of a Cascode Gallium Nitride Field Effect Transistor (2024)
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Temperature Scaling and C–V Modeling of SiC Low-Voltage MOSFETs for IC Design (2024)
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Impact of 6.5-kV SiC MOSFET Gate Bias on Reverse Recovery Over a Wide Temperature Range (2024)
Collaboration Network
Top Collaborators
- A review of silicon carbide CMOS technology for harsh environments
- 3.3 kV Low-Inductance Full SiC Power Module
- A Physics-based Simscape Compact SiC Power MOSFET Model with Temperature-Scaling
- Temperature Scaling and C–V Modeling of SiC Low-Voltage MOSFETs for IC Design
- Design of Low Parasitic Inductance GaN HEMT Flip-Chip Power Module
Showing 5 of 18 shared publications
- Design of Low Parasitic Inductance GaN HEMT Flip-Chip Power Module
- Compact Model of β-Ga2O3 Schottky Barrier Diode
- High Temperature Characterization and Degradation Test of a Cascode Gallium Nitride Field Effect Transistor
- Compact Modeling of β -Ga 2 O 3 Lateral Depletion Mode MOSFET
- Thermal Analysis and Modeling of Gallium Oxide Diode-based Half Bridge Power Module
Showing 5 of 9 shared publications
- A Physics-based Simscape Compact SiC Power MOSFET Model with Temperature-Scaling
- Temperature Scaling and C–V Modeling of SiC Low-Voltage MOSFETs for IC Design
- Single Event Upset in Depletion-Mode Gallium Oxide MOSFETs at the Breakdown Region
- Deep Cryogenic Characterization of GaN HEMT at 4K
- Compact Model of β-Ga2O3 Schottky Barrier Diode
Showing 5 of 8 shared publications
- Design of Low Parasitic Inductance GaN HEMT Flip-Chip Power Module
- Compact Model of β-Ga2O3 Schottky Barrier Diode
- High Temperature Characterization and Degradation Test of a Cascode Gallium Nitride Field Effect Transistor
- Compact Modeling of β -Ga 2 O 3 Lateral Depletion Mode MOSFET
- Thermal Analysis and Modeling of Gallium Oxide Diode-based Half Bridge Power Module
Showing 5 of 6 shared publications
- Compact Model of β-Ga2O3 Schottky Barrier Diode
- Breakdown and C-V Characteristics Analysis of Depletion Mode Lateral β-Ga2O3 MOSFET
- Compact Model for a Ferroelectric Capacitor Compatible with Integrated Circuit Design in Harsh Environment
- SEU Effect in E-Mode β-Ga 2 О 3 MOSFET with Epitaxial Drift Layer at the Breakdown Region
- DC Modeling of 8 kV Depletion Mode Gallium Oxide MOSFET
- Design of Low Parasitic Inductance GaN HEMT Flip-Chip Power Module
- Compact Model of β-Ga2O3 Schottky Barrier Diode
- Thermal Analysis and Modeling of Gallium Oxide Diode-based Half Bridge Power Module
- 3.3 kV Low-Inductance Full SiC Power Module
- Thermal Analysis and Modeling of Gallium Oxide Diode-based Half Bridge Power Module
- 3.3 kV Low-Inductance Full SiC Power Module
- Impact of 6.5-kV SiC MOSFET Gate Bias on Reverse Recovery Over a Wide Temperature Range
- 3.3 kV Low-Inductance Full SiC Power Module
- Impact of 6.5-kV SiC MOSFET Gate Bias on Reverse Recovery Over a Wide Temperature Range
- 3.3 kV Low-Inductance Full SiC Power Module
- Impact of 6.5-kV SiC MOSFET Gate Bias on Reverse Recovery Over a Wide Temperature Range
- A 0.8 V Bandgap Voltage Reference with High PSRR for Low-Dropout Voltage Regulator in 22nm FD-SOI
- Threshold Voltage Extraction Method for Low-Voltage SiC MOSFETs at High-Temperature
- A 0.8 V Bandgap Voltage Reference with High PSRR for Low-Dropout Voltage Regulator in 22nm FD-SOI
- Threshold Voltage Extraction Method for Low-Voltage SiC MOSFETs at High-Temperature
- A review of silicon carbide CMOS technology for harsh environments
- A New Simulation Method to Assess Temperature and Radiation Effects on SiC Resonant-Converter Reliability
- A review of silicon carbide CMOS technology for harsh environments
- A New Simulation Method to Assess Temperature and Radiation Effects on SiC Resonant-Converter Reliability
- Compact Model for a Ferroelectric Capacitor Compatible with Integrated Circuit Design in Harsh Environment
- Compact Modeling of β -Ga 2 O 3 Lateral Depletion Mode MOSFET
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