Serhii B. Kryvyi
Affiliation confirmed via AI analysis of OpenAlex, ORCID, and web sources.
Research Associate NANO 109
Also affiliated: National Academy of Sciences of Ukraine (2015–2020); Institute of Physics (2019–2025); V.E. Lashkaryov Institute of Semiconductor Physics (2015–2022); Polish Academy of Sciences (2019–2025)
Research Areas
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Biography and Research Information
OverviewAI-generated summary
Serhii B. Kryvyi's research focuses on the synthesis and characterization of nanomaterials, with recent work investigating composite nanoporous zeolite–carbon thin films for antireflection enhancement. His publications explore the properties of materials such as GaN/AlN superlattices grown on vicinal substrates, examining strain relaxation through comparative X-ray diffraction and atomic force microscopy studies. Kryvyi has also studied the dispersion properties of surface plasmons in porous gold films and the formation of nanoporous anodic alumina via anodization of aluminum films. Further research includes the self-aggregation of gold nanoparticles on functionalized surfaces and the investigation of large negative magnetoresistance in antiferromagnetic Gd2Se3. Kryvyi has a publication record of 54 papers, with 283 citations and an h-index of 10. He has collaborated extensively with researchers at the University of Arkansas at Fayetteville, including Fernando Maia de Oliveira (14 shared publications), Hryhorii Stanchu (12 shared publications), Gregory J. Salamo (10 shared publications), and Yuriy I. Mazur (9 shared publications).
Metrics
- h-index: 10
- Publications: 51
- Citations: 284
Positions
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Research Associate NANO 109 publications 2023–2026University of Arkansas at Fayetteville Listing
Selected Publications
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Interface-Driven Growth Mode Control of 2D GaSe on 3D GaAs Substrates with Distinct Crystallographic Orientations (2026)
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From Pd to Pd/Au and Pd/Ni/Au: Structural and interfacial characterization of ohmic contacts to p-GaN (2026)
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Strain Relaxation and Relative Defect Density with Thickness in MBE-Grown Ge 0.85 Sn 0.15 on Ge(001) (2026)
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Determination of composition, strain, and layer thickness of germanium-tin superlattices using x-ray diffraction (2026)
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Impedance spectroscopy and AC conductivity mechanism in GeSn thin films (2026)
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Interface-Driven Growth Mode Control of 2D GaSe on 3D GaAs Substrates with Distinct Crystallographic Orientations (2026)arXiv (Cornell University) OpenAlex
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Effects of short- and long-range disorder in the photoluminescence of GaAs 1 − x Sb x / GaAs quantum wells (2025)
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X-ray diffraction study of Ge islands on Si(001) grown by aspect ratio trapping (2025)
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Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn (2025)
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MBE growth and characterization of strained GeSn/Ge multiple quantum well structures (2025)
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Large negative magnetoresistance in antiferromagnetic G d 2 S e 3 (2025)
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Pros and Cons of (NH4)2S Solution Treatment of p-GaN/Metallization Interface: Perspectives for Laser Diode (2024)
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High-Quality Single-Step Growth of GaAs on C-Plane Sapphire by Molecular Beam (2024)
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Improved Quality of InN Thin Films Using a Thin InGaN Compressive Strain Gradient Layer (2024)
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Algorithm-Based Linearly Graded Compositions of GeSn on GaAs (001) via Molecular Beam Epitaxy (2024)
Collaboration Network
Top Collaborators
- MBE growth and characterization of strained GeSn/Ge multiple quantum well structures
- Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn
- Comprehensive material study of Ge grown by aspect ratio trapping on Si substrate
- High-Quality Single-Step Growth of GaAs on C-Plane Sapphire by Molecular Beam
- Effects of ion implantation with arsenic and boron in germanium-tin layers
Showing 5 of 15 shared publications
- Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn
- Comprehensive material study of Ge grown by aspect ratio trapping on Si substrate
- High-Quality Single-Step Growth of GaAs on C-Plane Sapphire by Molecular Beam
- Effects of ion implantation with arsenic and boron in germanium-tin layers
- The Epitaxial Growth of Ge and GeSn Semiconductor Thin Films on C-Plane Sapphire
Showing 5 of 11 shared publications
- MBE growth and characterization of strained GeSn/Ge multiple quantum well structures
- Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn
- Comprehensive material study of Ge grown by aspect ratio trapping on Si substrate
- High-Quality Single-Step Growth of GaAs on C-Plane Sapphire by Molecular Beam
- Effects of ion implantation with arsenic and boron in germanium-tin layers
Showing 5 of 10 shared publications
- MBE growth and characterization of strained GeSn/Ge multiple quantum well structures
- Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn
- Comprehensive material study of Ge grown by aspect ratio trapping on Si substrate
- High-Quality Single-Step Growth of GaAs on C-Plane Sapphire by Molecular Beam
- Effects of ion implantation with arsenic and boron in germanium-tin layers
Showing 5 of 9 shared publications
- MBE growth and characterization of strained GeSn/Ge multiple quantum well structures
- Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn
- Comprehensive material study of Ge grown by aspect ratio trapping on Si substrate
- Effects of ion implantation with arsenic and boron in germanium-tin layers
- The Epitaxial Growth of Ge and GeSn Semiconductor Thin Films on C-Plane Sapphire
Showing 5 of 9 shared publications
- MBE growth and characterization of strained GeSn/Ge multiple quantum well structures
- Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn
- High-Quality Single-Step Growth of GaAs on C-Plane Sapphire by Molecular Beam
- The Epitaxial Growth of Ge and GeSn Semiconductor Thin Films on C-Plane Sapphire
- Algorithm-Based Linearly Graded Compositions of GeSn on GaAs (001) via Molecular Beam Epitaxy
Showing 5 of 8 shared publications
- MBE growth and characterization of strained GeSn/Ge multiple quantum well structures
- Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn
- Comprehensive material study of Ge grown by aspect ratio trapping on Si substrate
- Determination of composition, strain, and layer thickness of germanium-tin superlattices using x-ray diffraction
- Effects of short- and long-range disorder in the photoluminescence of GaAs 1 − x Sb x / GaAs quantum wells
Showing 5 of 7 shared publications
- High-Quality Single-Step Growth of GaAs on C-Plane Sapphire by Molecular Beam
- The Epitaxial Growth of Ge and GeSn Semiconductor Thin Films on C-Plane Sapphire
- Algorithm-Based Linearly Graded Compositions of GeSn on GaAs (001) via Molecular Beam Epitaxy
- Algorithm-Based Linearly Graded Compositions of GeSn on GaAs (001) via Molecular Beam Epitaxy
- Interface-Driven Growth Mode Control of 2D GaSe on 3D GaAs Substrates with Distinct Crystallographic Orientations
Showing 5 of 6 shared publications
- High-Quality Single-Step Growth of GaAs on C-Plane Sapphire by Molecular Beam
- The Epitaxial Growth of Ge and GeSn Semiconductor Thin Films on C-Plane Sapphire
- Algorithm-Based Linearly Graded Compositions of GeSn on GaAs (001) via Molecular Beam Epitaxy
- Algorithm-Based Linearly Graded Compositions of GeSn on GaAs (001) via Molecular Beam Epitaxy
- Interface-Driven Growth Mode Control of 2D GaSe on 3D GaAs Substrates with Distinct Crystallographic Orientations
Showing 5 of 6 shared publications
- MBE growth and characterization of strained GeSn/Ge multiple quantum well structures
- Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn
- Comprehensive material study of Ge grown by aspect ratio trapping on Si substrate
- Effects of ion implantation with arsenic and boron in germanium-tin layers
- Determination of composition, strain, and layer thickness of germanium-tin superlattices using x-ray diffraction
Showing 5 of 6 shared publications
- MBE growth and characterization of strained GeSn/Ge multiple quantum well structures
- Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn
- Improved Quality of InN Thin Films Using a Thin InGaN Compressive Strain Gradient Layer
- Determination of composition, strain, and layer thickness of germanium-tin superlattices using x-ray diffraction
- Strain Relaxation and Relative Defect Density with Thickness in MBE-Grown Ge 0.85 Sn 0.15 on Ge(001)
- MBE growth and characterization of strained GeSn/Ge multiple quantum well structures
- Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn
- Improved Quality of InN Thin Films Using a Thin InGaN Compressive Strain Gradient Layer
- Determination of composition, strain, and layer thickness of germanium-tin superlattices using x-ray diffraction
- Strain Relaxation and Relative Defect Density with Thickness in MBE-Grown Ge 0.85 Sn 0.15 on Ge(001)
- High-Quality Single-Step Growth of GaAs on C-Plane Sapphire by Molecular Beam
- The Epitaxial Growth of Ge and GeSn Semiconductor Thin Films on C-Plane Sapphire
- Algorithm-Based Linearly Graded Compositions of GeSn on GaAs (001) via Molecular Beam Epitaxy
- Algorithm-Based Linearly Graded Compositions of GeSn on GaAs (001) via Molecular Beam Epitaxy
- MBE growth and characterization of strained GeSn/Ge multiple quantum well structures
- Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn
- Determination of composition, strain, and layer thickness of germanium-tin superlattices using x-ray diffraction
- Strain Relaxation and Relative Defect Density with Thickness in MBE-Grown Ge 0.85 Sn 0.15 on Ge(001)
- Palladium-Based Contacts on p-GaN and Their Application in Laser Diodes
- Pros and Cons of (NH4)2S Solution Treatment of p-GaN/Metallization Interface: Perspectives for Laser Diode
- From Pd to Pd/Au and Pd/Ni/Au: Structural and interfacial characterization of ohmic contacts to p-GaN
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