Serhii Kryvyi Data-verified

Affiliation confirmed via AI analysis of OpenAlex, ORCID, and web sources.

Research Associate NANO 109

Last publication 2026 Last refreshed 2026-05-16

postdoc

9 h-index 53 pubs 250 cited

Biography and Research Information

OverviewAI-generated summary

Serhii Kryvyi's research focuses on the structural and electronic properties of semiconductor materials, particularly III-nitrides and oxides. He has investigated spontaneous polarization models and induced electric fields in III-nitride multi-quantum wells. His work also includes the growth and characterization of materials such as polar and non-polar Zn1−xMgxO:Sb, ZnO/MgO superlattices, and Ge by aspect ratio trapping on Si substrates using molecular beam epitaxy (MBE). Kryvyi has explored the incorporation and segregation of elements like Bi in core-shell nanowires, and the reconstruction of three-dimensional strain fields in asymmetrical hetero-nanowires. Additionally, his research extends to palladium-based contacts on p-GaN for laser diode applications and the study of large negative magnetoresistance in antiferromagnetic Gd2Se3. Kryvyi has published 48 papers with 241 citations and an h-index of 9, and collaborates extensively with researchers at the University of Arkansas.

Metrics

  • h-index: 9
  • Publications: 53
  • Citations: 250

Selected Publications

  • Determination of composition, strain, and layer thickness of germanium-tin superlattices using x-ray diffraction (2026)
  • Impedance spectroscopy and AC conductivity mechanism in GeSn thin films (2026)
  • Effects of short- and long-range disorder in the photoluminescence of <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:mrow> <mml:msub> <mml:mi>GaAs</mml:mi> <mml:mrow> <mml:mn>1</mml:mn> <mml:mo>−</mml:mo> <mml:mi>x</mml:mi> </mml:mrow> </mml:msub> <mml:msub> <mml:mi>Sb</mml:mi> <mml:mi>x</mml:mi> </mml:msub> <mml:mo>/</mml:mo> <mml:mi>GaAs</mml:mi> </mml:mrow> </mml:math> quantum wells (2025)
  • X-ray diffraction study of Ge islands on Si(001) grown by aspect ratio trapping (2025)
  • Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn (2025)
    4 citations DOI OpenAlex
  • MBE growth and characterization of strained GeSn/Ge multiple quantum well structures (2025)
    7 citations DOI OpenAlex
  • Large negative magnetoresistance in antiferromagnetic <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mrow><mml:mi mathvariant="normal">G</mml:mi><mml:msub><mml:mi mathvariant="normal">d</mml:mi><mml:mn>2</mml:mn></mml:msub><mml:mi mathvariant="normal">S</mml:mi><mml:msub><mml:mi mathvariant="normal">e</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:mrow></mml:math> (2025)
    5 citations DOI OpenAlex
  • Pros and Cons of (NH4)2S Solution Treatment of p-GaN/Metallization Interface: Perspectives for Laser Diode (2024)
    1 citation DOI OpenAlex
  • High-Quality Single-Step Growth of GaAs on C-Plane Sapphire by Molecular Beam (2024)
    1 citation DOI OpenAlex
  • Improved Quality of InN Thin Films Using a Thin InGaN Compressive Strain Gradient Layer (2024)
  • Algorithm-Based Linearly Graded Compositions of GeSn on GaAs (001) via Molecular Beam Epitaxy (2024)
    2 citations DOI OpenAlex
  • The Epitaxial Growth of Ge and GeSn Semiconductor Thin Films on C-Plane Sapphire (2024)
    1 citation DOI OpenAlex
  • Effects of ion implantation with arsenic and boron in germanium-tin layers (2024)
    2 citations DOI OpenAlex
  • Comprehensive material study of Ge grown by aspect ratio trapping on Si substrate (2024)
    4 citations DOI OpenAlex
  • Palladium-Based Contacts on p-GaN and Their Application in Laser Diodes (2023)
    5 citations DOI OpenAlex

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Collaboration Network

134 Collaborators 29 Institutions 9 Countries

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