Match tier Confirmed
Presence Current · Arkansas
Last published 2026
Sources OpenAlex · ORCID
Refreshed 2026-08-08

Nirosh M. Eldose

Affiliation confirmed via AI analysis of OpenAlex, ORCID, and web sources.

Post doctoral research

Also affiliated: Center for NanoScience (2026); Heriot-Watt University (2018–2019); Council of Scientific and Industrial Research (2014); CSIR National Physical Laboratory of India (2014)

Postdoc Researcher

4 h-index 27 pubs 54 cited

Biography and Research Information

OverviewAI-generated summary

Nirosh M. Eldose's research focuses on the growth and characterization of semiconductor materials for optoelectronic applications. His work has investigated germanium-tin (GeSn) alloys and quantum well structures, exploring their properties for use in integrated photonics platforms. Eldose has published on the growth of pseudomorphic GeSn with high tin composition and the optical and structural characteristics of GeSn/SiGeSn multiple quantum wells for infrared optoelectronics. His research also includes enhancing carrier collection efficiency in GeSn single quantum wells, contributing to the development of all-group-IV photonics. Additionally, Eldose has examined the impact of annealing on the photoluminescence of GeSn alloys and the thermal stability of gallium nitride-based magnetic field sensors. He has a publication record of 27 works, with 53 citations and an h-index of 4. Eldose has collaborated extensively with researchers at the University of Arkansas at Fayetteville, including Oluwatobi Olorunsola, Fernando Maia de Oliveira, Hryhorii Stanchu, and Yuriy I. Mazur.

Metrics

  • h-index: 4
  • Publications: 27
  • Citations: 54

Selected Publications

  • Strain Relaxation and Relative Defect Density with Thickness in MBE-Grown Ge <sub>0.85</sub> Sn <sub>0.15</sub> on Ge(001) (2026)
    Crystal Growth & Design DOI OpenAlex
  • Tunable direct bandgap photoluminescence of GeSn grown on Ge/Si(100) substrate by molecular beam epitaxy growth (2026)
    Journal of Physics D Applied Physics DOI OpenAlex
  • STM and ARPES characterization of quality of GeSn grown on Ge(001) for atomic ordering investigations (2026)
    Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 1 citation DOI OpenAlex
  • Temperature-Dependent Sn Incorporation and Defect Formation in Pseudomorphic SiSn Layers on Si (001) via Molecular Beam Epitaxy (2026)
    Crystals DOI OpenAlex
  • Epitaxial Growth and Structural Evolution of Lattice-Matched SiGeSn/Ge Heterostructures with Si Composition up to 42% (2026)
    SSRN Electronic Journal DOI OpenAlex
  • Determination of composition, strain, and layer thickness of germanium-tin superlattices using x-ray diffraction (2026)
    Applied Physics Letters 2 citations DOI OpenAlex
  • GeSn alloys with ∼21% Sn grown by effusion cell molecular beam epitaxy (2026)
    Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 1 citation DOI OpenAlex
  • Dislocation-Related Photoluminescence Emission in MBE-Grown GeSn (2025)
    Crystal Growth & Design 7 citations DOI OpenAlex
  • MBE growth and characterization of strained GeSn/Ge multiple quantum well structures (2025)
    Journal of Physics D Applied Physics 10 citations DOI OpenAlex
  • Effect of temperature on the stability and performance of III-nitride HEMT magnetic field sensors (2024)
    Applied Physics Letters 1 citation DOI OpenAlex
  • Improved Quality of InN Thin Films Using a Thin InGaN Compressive Strain Gradient Layer (2024)
    Crystal Growth & Design 1 citation DOI OpenAlex
  • Epitaxial growth and characterization of GaAs (111) on 4H-SiC (2024)
    Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 1 citation DOI OpenAlex
  • Growth of Germanium Thin Films on Sapphire Using Molecular Beam Epitaxy (2023)
    Crystals 3 citations DOI OpenAlex
  • Strain-Mediated Sn Incorporation and Segregation in Compositionally Graded Ge<sub>1–<i>x</i></sub>Sn<sub><i>x</i></sub> Epilayers Grown by MBE at Different Temperatures (2023)
    Crystal Growth & Design 9 citations DOI OpenAlex
  • Thermal stability study of gallium nitride based magnetic field sensor (2023)
    Journal of Applied Physics 8 citations DOI OpenAlex

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Collaboration Network

86 Collaborators 16 Institutions 7 Countries

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