Joshua M. Grant
Researcher
Also affiliated: Wilkes University (2022); San Fernando General Hospital (1966); Space Photonics (United States) (2020); ITT Technical Institute (1962)
Faculty Researcher
Research Areas
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Biography and Research Information
OverviewAI-generated summary
Joshua M. Grant's research focuses on the development and study of group-IV semiconductor materials, particularly Germanium-Tin (GeSn) and Silicon-Germanium-Tin (SiGeSn) alloys, for photonic applications. His work investigates the growth of these materials using techniques such as ultra-high vacuum chemical vapor deposition (UHV-CVD) and aspect ratio trapping on silicon substrates. Grant has published research on electrically injected GeSn lasers emitting in the mid-infrared spectrum, achieving peak wavelengths up to 2.7 μm, and exploring dual-wavelength emission from SiGeSn mid-IR lasers. His studies also examine quantum well structures within these materials for integration into silicon photonics platforms, with a focus on enhancing carrier collection efficiency and understanding optical confinement factors. Grant collaborates extensively with researchers at the University of Arkansas at Fayetteville, including Wei Du, Solomon Ojo, Shui-Qing Yu, and Hryhorii Stanchu, with whom he shares multiple publications.
Metrics
- h-index: 13
- Publications: 41
- Citations: 943
Selected Publications
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<i>In-situ</i> real-time monitoring of GeSn growth using UHV-CVD to achieve high-quality material with lasing at 2250 nm and 100 K [Invited] (2025)
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Gas Phase Reactions Determined by In Situ Mass Spectrometric Investigation for GeSn Chemical Vapor Deposition Processes (2025)
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Development of aspect ratio trapping growth of GeSn on Si for midwave infrared applications (2024)
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<i>In situ</i> mass spectrometric investigation to probe GeSn growth dynamics and mechanisms in the chemical vapor deposition processes (2024)
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Comprehensive material study of Ge grown by aspect ratio trapping on Si substrate (2024)
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Study of all-group-IV SiGeSn mid-IR lasers with dual wavelength emission (2023)
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Study of SiGeSn-based multiple quantum well laser for photonics integrated circuits (2023)
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Investigation of the cap layer for improved GeSn multiple quantum well laser performance (2023)
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Low Pressure Growth of Pseudomorphic Gesn with 16.7% Sn Incorporation (2022)
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Study of critical optical confinement factor for GeSn-based multiple quantum well lasers (2022)
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Enhanced carrier collection efficiency of GeSn single quantum well towards all-group-IV photonics applications (2022)
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Growth of Pseudomorphic GeSn at Low Pressure with Sn Composition of 16.7% (2021)
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Electrically injected GeSn lasers with peak wavelength up to 2.7 μm (2021)
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Growth and characterization of low-temperature Si<sub>1-x</sub>Sn<sub>x</sub> on Si using plasma enhanced chemical vapor deposition (2020)
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Electrically injected GeSn lasers on Si operating up to 100 K (2020)
Collaboration Network
Top Collaborators
- Electrically injected GeSn lasers with peak wavelength up to 2.7 μm
- Growth of Pseudomorphic GeSn at Low Pressure with Sn Composition of 16.7%
- Study of all-group-IV SiGeSn mid-IR lasers with dual wavelength emission
- Enhanced carrier collection efficiency of GeSn single quantum well towards all-group-IV photonics applications
- Study of critical optical confinement factor for GeSn-based multiple quantum well lasers
Showing 5 of 13 shared publications
- Electrically injected GeSn lasers with peak wavelength up to 2.7 μm
- Growth of Pseudomorphic GeSn at Low Pressure with Sn Composition of 16.7%
- Study of all-group-IV SiGeSn mid-IR lasers with dual wavelength emission
- Enhanced carrier collection efficiency of GeSn single quantum well towards all-group-IV photonics applications
- Study of critical optical confinement factor for GeSn-based multiple quantum well lasers
Showing 5 of 11 shared publications
- Electrically injected GeSn lasers with peak wavelength up to 2.7 μm
- Growth of Pseudomorphic GeSn at Low Pressure with Sn Composition of 16.7%
- Study of all-group-IV SiGeSn mid-IR lasers with dual wavelength emission
- Enhanced carrier collection efficiency of GeSn single quantum well towards all-group-IV photonics applications
- Study of critical optical confinement factor for GeSn-based multiple quantum well lasers
Showing 5 of 9 shared publications
- Growth of Pseudomorphic GeSn at Low Pressure with Sn Composition of 16.7%
- Study of all-group-IV SiGeSn mid-IR lasers with dual wavelength emission
- Enhanced carrier collection efficiency of GeSn single quantum well towards all-group-IV photonics applications
- Study of critical optical confinement factor for GeSn-based multiple quantum well lasers
- Comprehensive material study of Ge grown by aspect ratio trapping on Si substrate
Showing 5 of 9 shared publications
- Electrically injected GeSn lasers with peak wavelength up to 2.7 μm
- Growth of Pseudomorphic GeSn at Low Pressure with Sn Composition of 16.7%
- Study of all-group-IV SiGeSn mid-IR lasers with dual wavelength emission
- Enhanced carrier collection efficiency of GeSn single quantum well towards all-group-IV photonics applications
- Study of critical optical confinement factor for GeSn-based multiple quantum well lasers
Showing 5 of 8 shared publications
- Study of all-group-IV SiGeSn mid-IR lasers with dual wavelength emission
- Enhanced carrier collection efficiency of GeSn single quantum well towards all-group-IV photonics applications
- Comprehensive material study of Ge grown by aspect ratio trapping on Si substrate
- Development of aspect ratio trapping growth of GeSn on Si for midwave infrared applications
- <i>In-situ</i> real-time monitoring of GeSn growth using UHV-CVD to achieve high-quality material with lasing at 2250 nm and 100 K [Invited]
Showing 5 of 7 shared publications
- Electrically injected GeSn lasers with peak wavelength up to 2.7 μm
- Enhanced carrier collection efficiency of GeSn single quantum well towards all-group-IV photonics applications
- Comprehensive material study of Ge grown by aspect ratio trapping on Si substrate
- Development of aspect ratio trapping growth of GeSn on Si for midwave infrared applications
- Study of SiGeSn-based multiple quantum well laser for photonics integrated circuits
- Electrically injected GeSn lasers with peak wavelength up to 2.7 μm
- Enhanced carrier collection efficiency of GeSn single quantum well towards all-group-IV photonics applications
- <i>In-situ</i> real-time monitoring of GeSn growth using UHV-CVD to achieve high-quality material with lasing at 2250 nm and 100 K [Invited]
- Investigation of the cap layer for improved GeSn multiple quantum well laser performance
- Study of SiGeSn-based multiple quantum well laser for photonics integrated circuits
- Growth of Pseudomorphic GeSn at Low Pressure with Sn Composition of 16.7%
- Enhanced carrier collection efficiency of GeSn single quantum well towards all-group-IV photonics applications
- Investigation of the cap layer for improved GeSn multiple quantum well laser performance
- Low Pressure Growth of Pseudomorphic Gesn with 16.7% Sn Incorporation
- Study of SiGeSn-based multiple quantum well laser for photonics integrated circuits
- Electrically injected GeSn lasers with peak wavelength up to 2.7 μm
- Study of all-group-IV SiGeSn mid-IR lasers with dual wavelength emission
- Study of critical optical confinement factor for GeSn-based multiple quantum well lasers
- Investigation of the cap layer for improved GeSn multiple quantum well laser performance
- Growth of Pseudomorphic GeSn at Low Pressure with Sn Composition of 16.7%
- Enhanced carrier collection efficiency of GeSn single quantum well towards all-group-IV photonics applications
- Low Pressure Growth of Pseudomorphic Gesn with 16.7% Sn Incorporation
- Study of SiGeSn-based multiple quantum well laser for photonics integrated circuits
- Enhanced carrier collection efficiency of GeSn single quantum well towards all-group-IV photonics applications
- Comprehensive material study of Ge grown by aspect ratio trapping on Si substrate
- <i>In-situ</i> real-time monitoring of GeSn growth using UHV-CVD to achieve high-quality material with lasing at 2250 nm and 100 K [Invited]
- Study of SiGeSn-based multiple quantum well laser for photonics integrated circuits
- Electrically injected GeSn lasers with peak wavelength up to 2.7 μm
- Growth of Pseudomorphic GeSn at Low Pressure with Sn Composition of 16.7%
- Study of SiGeSn-based multiple quantum well laser for photonics integrated circuits
- Electrically injected GeSn lasers with peak wavelength up to 2.7 μm
- <i>In situ</i> mass spectrometric investigation to probe GeSn growth dynamics and mechanisms in the chemical vapor deposition processes
- Gas Phase Reactions Determined by In Situ Mass Spectrometric Investigation for GeSn Chemical Vapor Deposition Processes
- Study of all-group-IV SiGeSn mid-IR lasers with dual wavelength emission
- Enhanced carrier collection efficiency of GeSn single quantum well towards all-group-IV photonics applications
- Study of SiGeSn-based multiple quantum well laser for photonics integrated circuits
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